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Jerome V
Jerome V
Associate
December 15, 2016
Solved

Test LSM6DS3 interrupt with Self Test

  • December 15, 2016
  • 3 replies
  • 1168 views
Posted on December 15, 2016 at 16:25

Hi Everybody, I want to test the interrupt of the LSM6DS3 sensor without any movement. Do you know if it is possible to generate an interrupt with the sensor self test ?

If I program a low interrupt threshold and I launch the self test of the sensor, is it possible to see the interruption ?

Thanks a lot for your help.

This topic has been closed for replies.
Best answer by Miroslav BATEK
Posted on December 16, 2016 at 12:13

There is a possibility to make the interrupt signals latched. When the LIR bit of TAP_CFG (58h) is set to 1, once the interrupt pin is asserted, it must be reset by reading the related interrupt source register.

3 replies

Seb
Seb
ST Employee
December 16, 2016
Posted on December 16, 2016 at 03:44

Most MEMs have an interrupt option for data ready. Run a one shot conversion (no FIFO) and the interrupt pin (if well configured) should toggle (assuming all is well configured for the output configuration)

Jerome V
Jerome VAuthor
Associate
December 16, 2016
Posted on December 16, 2016 at 08:40

Thank you Seb for your answer.

Do you know if a combo with the configuration registers permit to generate an interrupt on the pin with a big duration  in order to catch the interrupt ?

Seb
Seb
ST Employee
December 16, 2016
Posted on December 16, 2016 at 09:45

Check on the datasheet if the interrupt can be programmed at pulse or 'level until register cleared'.

With MCU connected to the pin, we only need a pulse and use EXTI IO edge detector to get the job done (with breakpoint or LED output for debug)

Jerome V
Jerome VAuthor
Associate
December 16, 2016
Posted on December 16, 2016 at 12:20

Thank you for your help !

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